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Doctoral Thesis
DOI
10.11606/T.76.1996.tde-14112007-091415
Document
Author
Full name
Carlos Alberto Fonzar Pintao
Institute/School/College
Knowledge Area
Date of Defense
Published
São Carlos, 1996
Supervisor
Committee
Gross, Bernhard (President)
Alfaro, Renê Armando Moreno
Ferreira, Guilherme Fontes Leal
Gregório Filho, Rinaldo
Oliveira, Luiz Nunes de
Title in Portuguese
Novo arranjo para determinar os coeficientes de emissão e a distribuição de energia dos elétrons secundários emitidos por sólidos
Keywords in Portuguese
Coeficientes de emissão
Distribuição de elétrons secundários
Elétrons secundários
Abstract in Portuguese
Neste trabalho estudou-se um novo arranjo de medida para se obter a distribuição de energia dos elétrons secundários emitidos e os coeficientes de emissão por um sólido. Pelo fato deste arranjo permitir a medida direta do potencial de superfície no caso dos polímeros e da ddp de contato no caso dos metais, foi possível aplicar e descrever teoricamente o método de medida empregado para determinar o espectro energético dos secundários para a platina, Teflon-FEP, Mylar, PVDF- α, PVDF- β e polimero condutor. As cargas acumuladas durante a irradiação dos polímeros foram compensadas através do próprio feixe eletrônico. Este procedimento não é muito usual em relação aqueles aplicados na literatura e mostrou-se bastante eficaz. Pela primeira vez empregou-se o método dinâmico para determinar o coeficiente de emissão total em função da energia dos elétrons incidentes nos metais e verificou-se que estes resultados são idênticos aqueles obtidos pelo método do pulso. Um desdobramento natural ao aplicar o método dinâmico aos metais foram as medidas realizadas para camadas de ouro com espessura de 50 nm, 10 nm e 2,5 nm depositada sobre o Teflon-FEP, que deram origem ao modelo das duas camadas na interpretação dos resultados experimentais.
Title in English
A new arragement determine the coefficients of the emission and the secondary electrons distribution emitted by solids
Keywords in English
Coefficients of the emission
Secondary electrons
Secondary electrons distribution
Abstract in English
A new arrangement of measure was developed in this study, in order to obtain the energy distribution from the emitted secondaries and the emission yields by a solid. Because this arrangement allowed the direct measurement of the surface potential, in the case of metals, it was possible to apply and describe theoretically the mensuration method employed, to determine the energy distribution of the secondaries to platinum, Teflon-FEP. Mylar, PVDF α, PVDF- β and thie conducting polymer. The charges accumulated during the polymers irradiation were compensated through the electronic beam itself. This proceeding is not very usual, as referring to the ones applied in literature, and it proved to be very efficacious. The dynamic method was employed for the first time to metals in order to determine the total emission yield in function of the energy of the inciding electrons and it was found out that these results were identical to the ones obtained through the pulse method. As a natural development, by applying the dynamic method to metals, the measurements achieved were also applied to golden layers 50 nm, 10 nm and 2,5 nm wide deposited on Teflon-FEP, and they gave birth to the two layers, in the interpretation of the experimental results.
 
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CarlosPintao.pdf (4.70 Mbytes)
Publishing Date
2007-11-14
 
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