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Master's Dissertation
DOI
10.11606/D.54.1988.tde-27032015-165146
Document
Author
Full name
Victor Hugo Etgens
Institute/School/College
Knowledge Area
Date of Defense
Published
São Carlos, 1988
Supervisor
Committee
Denicolo, Ireno
Rodrigues, Antonio Ricardo Droher
Torriani, Iris C Linares de
Title in Portuguese
Desenvolvimento e aplicação de câmara topográfica de Lang
Keywords in Portuguese
Não disponível
Abstract in Portuguese
Este trabalho trata do estudo de monocristais utilizando difração de raios-x (Câmara de Lang) a qual foi aplicada ao estudo de monocristais de silício e de sulfato de triglicina. No estudo de monocristais de silício, abordou-se detalhadamente a técnica de decoração de defeitos utilizando cobre como agente decorador. Foram analisadas topografias obtidas de ambos os cristais visando uma descrição qualitativa da perfeição cristalina dos mesmos
Title in English
Not available
Keywords in English
Not available
Abstract in English
The porpouse of this work is to study single crystals using x-ray diffraction techniques. Na x-ray topographic camera (Lang camera) was developed and applied to study silicon and triglicine sulfate single crystals. Copper decoration was used to reveal deffects in silicon crystals. The topographies obtained from both crystals were analized for an qualitative description of their crystalline perfection
 
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Publishing Date
2015-03-31
 
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