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Master's Dissertation
DOI
10.11606/D.43.1996.tde-02082013-144215
Document
Author
Full name
Andre Santarosa Ferlauto
E-mail
Institute/School/College
Knowledge Area
Date of Defense
Published
São Paulo, 1996
Supervisor
Committee
Quivy, Alain Andre (President)
Kleinke, Maurício Urban
Santos, Helena Lopes de Souza
Title in Portuguese
Construção e aplicações de um microscópio de tunelamento (STM)
Keywords in Portuguese
Filmes Finos
Instrumentação
Microscopia de tunelamento
STM
Superfícies
Abstract in Portuguese
O objetivo deste trabalho foi a construção de um microscópio de tunelarnento (STM) e sua aplicação a alguns tipos de materiais. Todas suas partes constituintes - cabeça de medida, sistema de isolamento contra vibrações, circuito eletrônico de retroalirnentação e programa computacional de controle - foram desenvolvidas c montadas em nosso laboratório. O aparelho foi testado e calibrado por medidas de interferência óptica e através de imagens da estrutura cristalina de grafite obtidas com o próprio instrumento. Foi realizado um estudo sobre filmes finos de ouro, otirnizando-se o processo de deposição por sputtering, para sua utilização corno cobertura de amostras isolantes a serem investigadas por microscopia eletrônica de varredura (SEM) ou de tunelarnento. Um método de preparo de amostras sernicondutoras foi proposto e utilizado no estudo inicial de pontos quânticos de InAs crescidos pela técnica de epitaxia por feixe molecular (MBE).
Title in English
Construction and applications of a tunneling microscope (STM)
Keywords in English
Instrumentation
STM
Surfaces
Thin Films
tunneling Microscopy
Abstract in English
The aim of this work was the construction of a scanning tunneling microscope (STM) and its application to some interesting physical systems. All its parts- measurement head, antivibration system, electronic feedback circuit and control software were developed and mounted in our laboratory. The instrument was tested and calibrated by optical interferometry and using images of the atomic structure of graphite obtained with the microscope itself. A systematic study of thin sputtered Au films was carried out in order to optimize the sputtering process for its use in the coverage of insulating samples to be investigated by scanning electron microscopy (SEM) and STM. We also proposed a new method to prepare semiconducting surfaces for STM measurements in air, which was used to study InAs quantum dots grown by molecular beam epitaxy (MBE).
 
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42268FERLAUTO2.pdf (5.47 Mbytes)
Publishing Date
2013-08-02
 
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