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Master's Dissertation
DOI
https://doi.org/10.11606/D.76.2014.tde-05062014-092420
Document
Author
Full name
Carolina Elisa Guillen Valencia
E-mail
Institute/School/College
Knowledge Area
Date of Defense
Published
São Carlos, 2014
Supervisor
Committee
Bruno, Odemir Martinez (President)
Felipe, Joaquim Cezar
Silva, Marcelo de Assumpcao Pereira da
Title in Portuguese
Sistema de análise de imagens SEBS por microscopia de força atômica
Keywords in Portuguese
Análise de imagens
Filmes finos copolímeros SEBS
Microscopia de forca atômica (AFM)
Abstract in Portuguese
Neste trabalho, se pretende caracterizar a morfologia de filmes finos poliméricos por meio de técnicas de processamento de imagens, utilizando principalmente a geometria computacional e técnicas de classificação de padrões. Os objetivos principais foram quantificar as grandezas geométricas das estruturas observadas nos filmes finos e descrever padrões de superfície formados nestes filmes. Foram estudadas imagens obtidas por microscopia de força atômica (AFM) de amostras de filmes finos SEBS [poliestireno-poli(etileno-co-butileno)-poliestireno], depositados sobre um substrato de mica por técnicas de imersão. Os filmes finos SEBS são considerados de grande interesse devido à formação de estruturas auto-organizadas na escala nanométrica. A caracterização e a obtenção da morfometria dos filmes são de relevância neste trabalho, pois contribuem para o entendimento da dinâmica de formação destes padrões nas nanoestruturas estudadas. Foram analisadas diferentes morfologias, como forma de gotículas com anéis concêntricos e forma de tiras e pontos regularmente espaçados. Os resultados obtidos permitem caracterizar os padrões observados.
Title in English
Image analysis system SEBS by atomic force microscopy
Keywords in English
Atomic force microscopy (AFM)
Image analysis
SEBS thin film polymers
Abstract in English
In this work, we intend to characterize the morphology of polymer thin films by techniques of image processing, mainly using computational geometry and pattern classification. The main objectives were to quantify the geometrical structures observed in thin films and describe surface patterns formed in these films. Were studied images obtained by atomic force microscopy (AFM) of SEBS [polystyrene-poly(ethylene-co-butylene)-polystyrene] thin films samples, deposited on a mica substrate by dip-coating technique . SEBS thin film polymers have great interest due to the formation of self-organized structures on the nanometer scale. The characterization and obtaining measurements of the morphology of the thin films are of relevance in this work, because they contribute to the understanding of the formation dynamics of these patterns in nanostructures studied. We analyzed different morphologies, such as droplets form with concentric rings and stripe and regularly spaced points forms. The results allow to characterize the observed patterns.
 
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Publishing Date
2014-06-10
 
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