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Doctoral Thesis
DOI
https://doi.org/10.11606/T.43.1989.tde-28022014-122015
Document
Author
Full name
Paulo Sizuo Waki
Institute/School/College
Knowledge Area
Date of Defense
Published
São Paulo, 1989
Supervisor
Committee
Pereira Neto, Jose Rezende (President)
Lima, Ivan Costa da Cunha
Pontuschka, Walter Maigon
Vargas, Helion
Watari, Kazunori
Title in Portuguese
Desenvolvimento do método LUC-APW com aplicação no estudo da estrutura eletrônica do silício
Keywords in Portuguese
Estrutura eletrônica
Abstract in Portuguese
Desenvolveu-se um processo para cálculo de faixas de energia aliando a aproximação de Células Unitárias Gigantes (LUC) e o método da Onda Plana Aumentada (APW) não muffin-tin. Os cálculos foram realizados para o diamante (2 átomos por célula) e silício (com 2 e 16 átomos por célula), usando a teoria de grupos para resolver o problema nos pontos de alta simetria da zona de Brillouin. Para o silício, com 16 átomos por célula primitiva, resultados satisfatórios foram obtidos a partir da utilização de 48 SAPWs na expansão da função de onda, o que representa um número bastante razoável neste tipo de cálculo. Nos estágios finais de desenvolvimento, o processo encontra-se em condições de ser aplicado no estudo de semi-condutores com impurezas (ou defeitos), sem a necessidade de grandes adaptações.
Title in English
Development of the LUC-APW method with application to the study of the electronic structure of silicon
Keywords in English
Electronic structure
Abstract in English
A procedure to calculate energy bands, using the Large Unit Cells approximation (LUC) by non muffin-tin Augmented Plane Waves (APW), was developed. The calculations were performed for the diamond (with 2 atoms in the primitive cell) and the silicon (with 2 and 16 atoms in the cell). The group theory was used on the high symmetry points of the Brillouin zone. With only 48 symmetrized APWs, good results were obtained for silicon with 16 atoms in the primitive cell. This is a reasonable basis set for this sort of calculations. This procedure may be readily applied to study semiconductors with impurities or defects.
 
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RE46090Waki.pdf (1,022.77 Kbytes)
Publishing Date
2014-03-12
 
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